Editorial Board Members

• Dr. Guiying Shen Institute of Semiconductors Research, Chinese Academy of Sciences, China
• Dr. Auttasit Tubtimtae Faculty of Liberal Arts and Science, Kasetsart University Kamphaeng Saen Campus, Thailand
• Dr. Doston Khasanov Turayevich Tashkent University of Information Technologies, Uzbekistan
• Dr. Zhixin Cui Western Digital Technology, United States
• Prof. Alireza Heidari President of American International Standards Institute (AISI), Irvine, California, USA.
• Dr. Francisco Bulnes Tecnológico de Estudios Superiores Chalco, Mexico
• Dr. Husam Abduldaem Mohammed Electronic and Communication Engineering Department, University of Baghdad, Iraq
• Dr. Patrick Dela Corte Cerna Federal Technological Institute University
• Dr. Rahima Nasrin University of Barisal, Bangladesh
• Prof. Zheng Han Shanxi University, China
• Prof. Subash T D Mangalam College of Engineering, India
• Dr. Yuanqi Shen Northwestern University, United States
• Dr. Elder Oroski Federal Technological University of Parana, Brazil
• Dr. Wenhui Yu University of Strasbourg, France
• Ass Prof. Girma Yohannis Bade Wolaita Sodo University,Ethiopia
• Dr. Akram Sheikhi Lorestan University, Iran, Islamic Republic of
• Dr. Mahdi Bahadoran Shiraz University of Technology, Iran, Islamic Republic of
• Dr. Muhammad Sana Ullah Florida Polytechnic University, United States
• Dr. Yunyan Zhang University College London, United Kingdom
• Dr. Shuo Gao Beihang University, China
• Dr. Luca Persichetti Roma Tre University, Italy
• Dr. Vajeeston Ponniah University of Oslo, Norway
• Dr. Thanikanti Sudhakar Babu Institute of Power Engineering, Universiti Tenaga Nasional (UNITEN), Malaysia
• Dr. Gennadiy Burlak Universidad Autónoma del Estado de Morelos, Mexico
• Prof. Ahmed El Oualkadi Abdelmalek Essaadi University, Morocco
• Prof. Luca Potì Interuniversity National Consortium for Telecommunications and Universitas Mercatorum, Italy
• Dr. Amalia N. Miliou Aristotle University of Thessaloniki, Greece
• Dr. Luka Strezoski Faculty of Technical Sciences, University of Novi Sad, Serbia
• Dr. Fikret Yildiz Hakkari University, Turkey
• Dr. Muhammad Waqas Iqbal Riphah International University, Lahore, Pakistan
• Dr. Ren Li Aarhus University, Denmark
• Dr. Niloufar Yavarishad University of Wisconsin-Milwaukee, United States
• Dr. Shi-Hai Dong Instituto Politecnico Nacional, Mexico
• Dr. Basanta Kumar Roul Central Research Laboratory, Bharat Electronics Limited, Bangalore, India
• Dr. Feng Li University of Idaho, United States
• Dr. Jie Song Yale University, United States
• Dr. Nihar R Pradhan Jackson State University, United States
• Dr. Meysam Zareiee Damghan University, Iran, Islamic Republic of
• Dr. Prajoon Pavithran Jyothi Engineering College, Cheruthuruthy, Kerala, India
• Dr. Dongyan Zhang Xidian University, China
• Dr. Tseung-Yuen Tseng National Chiao Tung University, Taiwan, China
• Dr. Boualem Djezzar Centre de Développement des Technologies Avancées, Algeria
• Dr. Suguo Huo London Centre for Nanotechnology, United Kingdom
• Prof. Miao Zhou Beihang University, China
• Dr. Swayandipta Dey Weizmann Institute of Science, Israel
• Dr. Abbas Mohammed Selman University of Kufa, Iraq
• Prof. Mebarka Daoudi University of Bechar, Algeria
• Prof. Bikash Nakarmi Nanjing University of Aeronautics and Astronautics, Nepal
• Dr. Sergey Ivanovich Pokutnyi Chuіko Institute of Surface Chemistry of National Academy of Sciences of Ukraine, Ukraine
• Dr. Hamed Dehdashti Jahromi Jahrom University, Iran, Islamic Republic of
• Dr. Shubhakar Kalya Singapore University Of Technology And Design (Sutd), Singapore
• Dr. Muhammad Azeem University of Sharjah, United Arab Emirates
• Dr. Riadul Islam University of Maryland Baltimore County, Baltimore, USA
• Dr. Chun-Hsiang Chang OmniVision Technologies,Inc., United States
• Dr. Chunqing Wang Harbin Institute of Technology, China
•